CAD for statistical analysis and design of microwave circuits

Statistical circuit design is essentially a method of design for reliability and high yield. For all but the smallest circuits, this is a CAD problem. Within this problem there are three subproblems: design centering, tolerance assignment, and variability reduction. This paper concentrates on design centering. Yield optimization is inherently a difficult problem because yield cannot, in general, be calculated exactly; only estimates of the yield are available. Furthermore, yield gradients are not available when some yield estimation techniques are used. This paper presents a review of useful definitions using parameter space concepts. Yield estimation techniques and some of their properties are also presented. The two distinct yield optimization strategies commercially available today, statistical and deterministic, are each discussed in detail. Examples of each are given.

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