Health monitoring method of note PC for cooling performance degradation and load assessment
暂无分享,去创建一个
[1] 高橋 浩之,et al. Thermal Fatigue Life Simulation for Sn-Ag-Cu Lead-Free Solder Joints , 2004 .
[2] L. Joseph,et al. Bayesian Statistics: An Introduction , 1989 .
[3] M. Pecht,et al. Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics , 2009, IEEE Transactions on Reliability.
[4] Bradley P. Carlin,et al. BAYES AND EMPIRICAL BAYES METHODS FOR DATA ANALYSIS , 1996, Stat. Comput..
[5] M.G. Pecht,et al. Computer Usage Monitoring for Design and Reliability Tests , 2009, IEEE Transactions on Components and Packaging Technologies.
[6] M. Pecht,et al. Baseline Performance of Notebook Computers Under Various Environmental and Usage Conditions for Prognostics , 2009, IEEE Transactions on Components and Packaging Technologies.
[7] T. Louis,et al. Bayes and Empirical Bayes Methods for Data Analysis. , 1997 .
[8] P. Lall,et al. Prognostics and health management of electronics , 2006, 2006 11th International Symposium on Advanced Packaging Materials: Processes, Properties and Interface.
[9] David B. Dunson,et al. Bayesian Data Analysis , 2010 .
[10] 石黒 真木夫. On the use of multiparameter models in statistical measurement techniques , 1984 .
[11] Michael Pecht,et al. Evaluation of built-in test , 2001 .
[12] Michael Pecht,et al. A life consumption monitoring methodology for electronic systems , 2003 .
[13] Hermann Haken,et al. Information and Self-Organization: A Macroscopic Approach to Complex Systems , 2010 .
[14] Takashi Kawakami,et al. Thermal Fatigue Life of Solder Bumps in BGA , 1998 .
[15] Michael Pecht,et al. Physics-of-failure-based prognostics for electronic products , 2009 .
[16] M. Pecht,et al. Early Detection of Interconnect Degradation by Continuous Monitoring of RF Impedance , 2009, IEEE Transactions on Device and Materials Reliability.
[17] Masaki Shiratori,et al. Statistical Optimization Method , 1970 .