Recovery during concurrent on-line testing of identical circuits
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[1] Kewal K. Saluja,et al. Fault tolerance through re-execution in multiscalar architecture , 2000, Proceeding International Conference on Dependable Systems and Networks. DSN 2000.
[2] Irith Pomeranz,et al. A method to enhance the fault coverage obtained by output response comparison of identical circuits , 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).
[3] Irith Pomeranz,et al. Concurrent on-line testing of identical circuits through output comparison using non-identical input vectors , 2004 .
[4] Melvin A. Breuer,et al. Digital systems testing and testable design , 1990 .
[5] Koppolu Sasidhar,et al. Hierarchical Diagnosis of Identical Units in a System , 2001, IEEE Trans. Computers.
[6] S. Griffis. EDITOR , 1997, Journal of Navigation.
[7] 장훈,et al. [서평]「Computer Organization and Design, The Hardware/Software Interface」 , 1997 .
[8] Dhiraj K. Pradhan,et al. Fault-tolerant computer system design , 1996 .
[9] Jacob Savir,et al. Built In Test for VLSI: Pseudorandom Techniques , 1987 .