Identifying the First Layer to Fail in Dual-Layer ${\rm SiO}_{\rm x}/{\rm HfSiON}$ Gate Dielectric Stacks
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Nagarajan Raghavan | Kin Leong Pey | Andrea Padovani | Luca Larcher | L. Larcher | A. Padovani | K. Pey | N. Raghavan
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