A comparative study of algorithms for A/D converter performance evaluation by statistical analysis

Three algorithms based on statistical analysis (histogram testing) are analysed: comparison with the theoretical histogram (method 1), determination of transition levels by means of histogram (method 2), normalised transfer function (method 3). Simulations are performed with a perfect ADC stimulated by a noisy input signal. The algorithms are compared in terms of DNLE mean value of the estimated DNLE (estimation bias) and, of the standard deviations of DNLE and INLE estimates.<<ETX>>