Robust design of Terminal ILC with an Internal Model Control using μ-analysis and a genetic algorithm approach
暂无分享,去创建一个
[1] J Baker,et al. REDUCING BIAS AND NEFFICIENCY IN THE SELECTION ALGORITHM, GENETIC ALGORITHMS AND APPLICATIONS , 2000 .
[2] Kevin L. Moore,et al. Iterative Learning Control: An Expository Overview , 1999 .
[3] Guy Gauthier. Terminal iterative learning control , 2004 .
[4] Patrick Girard,et al. A new absorption based model for sheet reheat in thermoforming , 2005 .
[5] C. E. M. Pearce,et al. Some New Bounds for Singular Values and Eigenvalues of Matrix Products , 2000, Ann. Oper. Res..
[6] Changyun Wen,et al. High-order terminal iterative learning control with an application to a rapid thermal process for chemical vapor deposition , 1999 .
[7] J. Doyle,et al. Robust and optimal control , 1995, Proceedings of 35th IEEE Conference on Decision and Control.
[8] Benoit Boulet,et al. Robust design of terminal ILC with H ∞ mixed sensitivity approach for a thermoforming oven , 2008 .
[9] Tong-heng Lee,et al. An Iterative Learning Control In Rapid Thermal Processing , 1997 .
[10] Benoit Boulet,et al. Advanced In-cycle and Cycle-to Cycle On-line Adaptive Control for Thermoforming of Large Thermoplastic Sheets , 2005 .
[11] S. Adivikolanu,et al. Extensions and performance/robustness tradeoffs of the EWMA run-to-run controller by using the internal model control structure , 2000 .
[12] Heinz Mühlenbein,et al. Predictive Models for the Breeder Genetic Algorithm I. Continuous Parameter Optimization , 1993, Evolutionary Computation.
[13] James L. Throne,et al. Technology of thermoforming , 1996 .
[14] S. Adivikolanu,et al. Internal model control approach to run-to-run control for semiconductor manufacturing , 1997, Proceedings of the 1997 American Control Conference (Cat. No.97CH36041).
[15] YangQuan Chen,et al. A high-order terminal iterative learning control scheme [RTP-CVD application] , 1997, Proceedings of the 36th IEEE Conference on Decision and Control.
[16] Petko H. Petkov,et al. Robust control design with MATLAB , 2005 .
[17] Evanghelos Zafiriou,et al. Robust run-to-run control for semiconductor manufacturing: an internal model control approach , 1998, Proceedings of the 1998 American Control Conference. ACC (IEEE Cat. No.98CH36207).
[18] David C. Drain. Run-to-Run Control in Semiconductor Manufacturing , 2002 .
[19] Mark Ajersch. Modeling and real-time control of sheet reheat phase in thermoforming , 2004 .