Secondary Electron Emission

Publisher Summary This chapter provides a review of the present state of knowledge of secondary electron emission (SE) by electrons from metals, insulators, and complex surfaces. A great deal of early work in SE was devoted to a careful analysis of the “fine structure” of the yield curve in which numerous small humps and inflexion points between zero and about 40 volts were revealed. Changes in temperature of the target may alter the density of adsorbed gas if present; they may alter the crystal structure or the surface roughness. Any of these may influence the SE yield. There is considerable experimental evidence to show that a rough or porous surface results in a lowering of the SE yield. The SE yield normally defines the average number of secondaries produced per impinging primary. At the present time, the available theories of SE can explain the process in general terms, however lack the detailed data necessary to give a complete quantitative description. Measurements of the yield from insulators require either that the potential of the bombarded surface be fixed or else that it be measured simultaneously with the SE measurement.

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