Displacement measurement with nanoscale resolution using a coded micro-mark and digital image correlation
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Wei Huang | Yuhang Chen | Chengfu Ma | Chengfu Ma | Yuhang Chen | Wei Huang
[1] Hugh Alan Bruck,et al. Digital image correlation using Newton-Raphson method of partial differential correction , 1989 .
[2] W. H. Peters,et al. Application of an optimized digital correlation method to planar deformation analysis , 1986, Image Vis. Comput..
[3] Wenhao Huang,et al. Design and analysis of two-dimensional zero-reference marks for alignment systems , 2003 .
[4] Wenhao Huang,et al. Comparative study on the nonperiodic and periodic gratings for scanning probe microscopy drift measurements , 2010 .
[5] Anand Asundi,et al. Two-dimensional digital image correlation for in-plane displacement and strain measurement: a review , 2009 .
[6] Wenhao Huang,et al. Application of a novel nonperiodic grating in scanning probe microscopy drift measurement. , 2007, The Review of scientific instruments.
[7] Xiangqun Cao,et al. A new subdivision method for grating-based displacement sensor using imaging array , 2009 .
[8] Stoyan N. Nihtianov,et al. Power-Efficient High-Speed and High-Resolution Capacitive-Sensor Interface for Subnanometer Displacement Measurements , 2012, IEEE Transactions on Instrumentation and Measurement.
[9] Patrick Sandoz,et al. Subpixelic Measurement of Large 1D Displacements: Principle, Processing Algorithms, Performances and Software , 2014, Sensors.
[10] Eusebio Bernabeu,et al. Design of two-dimensional zero reference codes by means of a global optimization method. , 2005, Optics express.
[11] Gaetano Scamarcio,et al. Simultaneous measurement of multiple target displacements by self-mixing interferometry in a single laser diode. , 2011, Optics express.
[12] W. F. Ranson,et al. Determination of displacements using an improved digital correlation method , 1983, Image Vis. Comput..
[13] G. Spiezia,et al. Design of a Linear Variable Differential Transformer With High Rejection to External Interfering Magnetic Field , 2010, IEEE Transactions on Magnetics.
[14] Wenhao Huang,et al. Optimization of zero-reference grating considering tip distortions for scanning probe microscopy drift measurement. , 2010, Journal of nanoscience and nanotechnology.
[15] Hugh A. Bruck,et al. A new method for characterizing nonlinearity in scanning probe microscopes using digital image correlation , 2005 .
[16] Manuel Guizar-Sicairos,et al. Efficient subpixel image registration algorithms. , 2008, Optics letters.
[17] Sancho Salcedo-Sanz,et al. Design of two-dimensional zero reference codes with a genetic algorithm. , 2006, Optics letters.
[18] Michael A. Sutton,et al. Influence of Scanning Rotation on Nanoscale Artificial Strain in Open-Loop Atomic Force Microscopy , 2011 .
[19] W. Peters,et al. Digital Imaging Techniques In Experimental Stress Analysis , 1982 .
[20] Slava Krylov,et al. Nanoscale displacement measurement of electrostatically actuated micro-devices using optical microscopy and digital image correlation , 2010 .
[21] Zhou Chenggang,et al. Alignment measurement of two-dimensional zero-reference marks , 2006 .
[22] W. F. Ranson,et al. Applications of digital-image-correlation techniques to experimental mechanics , 1985 .
[23] Chao-Kai Wen,et al. Design of two-dimensional zero reference codes with cross-entropy method. , 2010, Applied optics.
[24] J. Crassous,et al. A new capacitive sensor for displacement measurement in a surface force apparatus , 2001 .
[25] Jürgen Czarske,et al. Non-incremental interferometric displacement measurement using a laser Doppler sensor with phase coding , 2011 .
[26] Aristides A. G. Requicha,et al. Drift compensation for automatic nanomanipulation with scanning probe microscopes , 2006, IEEE Transactions on Automation Science and Engineering.
[27] Xie Huimin,et al. Performance of sub-pixel registration algorithms in digital image correlation , 2006 .
[28] Min-Kuan Chang,et al. Generation of Two-Dimensional Optical Reference Signals Based on Parametric Minimum Cross Entropy , 2011, IEEE Photonics Technology Letters.