DFT Techniques for Mixed-Signal Integrated Circuits

This chapter presents several design methods that can be used to improve the testability of mixed-signal integrated circuits. This work will begin by outlining the importance of test and its impact on product cost and quality. Following this, we will look at the impact of manufacturing defects on the functional behavior of analog and digital circuits. Subsequently, we shall outline several common test strategies, and their corresponding test setups for verifying the function of the analog portion of a mixed-signal circuit. The remainder of the chapter will look at design-for-test methods that include several analog test buses, including the proposed IEEE 1149.4 test bus standard, and several built-in self-test methods.

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