论文信息 - Tensile Straightening of Superfine Wire and Residual Stress Measurement Using Focused Ion Beam - 字舞流文

Tensile Straightening of Superfine Wire and Residual Stress Measurement Using Focused Ion Beam

Kazunari Yoshida | Kazunari Yoshida | Tsutomu Yamashita | Tsutomu Yamashita

[1] T. Kamino,et al. Pin-Point Characterization of Nano-Materials Using FIB Technique , 2002 .