Some New Techniques With Digital Speckle Pattern Interferometry (DSPI)

Digital Speckle Pattern Interferometry (DSPI) is presented as a real-time technique for a number of applications such as measurement of small displacements, displacement derivatives, contouring, and non-destructive testing. The implementation of DSPI on a commercially available image processing system is described. A method of fringe sharpening in DSPI is also presented.