Parameter Identification of a Cantilever Beam Immersed in Viscous Fluids With Potential Applications to the Probe Calibration of Atomic Force Microscopes
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[1] Sverre Myhra,et al. Calibration of AFM cantilever spring constants. , 2003, Ultramicroscopy.
[2] J. Sader,et al. Method for the calibration of atomic force microscope cantilevers , 1995 .
[3] James D. Holbery,et al. Experimental determination of scanning probe microscope cantilever spring constants utilizing a nanoindentation apparatus , 2000 .
[4] Jon R. Pratt,et al. SI-Traceable Spring Constant Calibration of Microfabricated Cantilevers for Small Force Measurement , 2007 .
[5] Hans-Jürgen Butt,et al. Calculation of thermal noise in atomic force microscopy , 1995 .
[6] Sverre Myhra,et al. Determination of the spring constants of probes for force microscopy/spectroscopy , 1996 .
[7] John E. Sader,et al. General scaling law for stiffness measurement of small bodies with applications to the atomic force microscope , 2005 .
[8] Wenlung Li,et al. Evaluation of the damping ratio for a base-excited system by the modulations of responses , 2005 .
[9] R. Lévy,et al. Measuring the spring constant of atomic force microscope cantilevers: thermal fluctuations and other methods , 2002 .
[10] Manfred H. Jericho,et al. Device for the determination of spring constants of atomic force microscope cantilevers and micromachined springs , 2002 .
[11] Saeid Bashash,et al. Nanomechanical cantilever active probes for ultrasmall mass detection , 2009 .
[12] Lawrence A Bottomley,et al. A method for calculating the spring constant of atomic force microscopy cantilevers with a nonrectangular cross section. , 2005, Analytical chemistry.
[13] J. Bechhoefer,et al. Calibration of atomic‐force microscope tips , 1993 .
[14] Martyn C. Davies,et al. Comparison of calibration methods for atomic-force microscopy cantilevers , 2002 .
[15] Wenlung Li,et al. The linearization method based on the equivalence of dissipated energies for nonlinearly damped structural systems , 2006 .
[16] Vladimir Mancevski,et al. Calibration of a dual probe NanoCaliper AFM for CD metrology , 2005, SPIE Advanced Lithography.
[17] R. Stark,et al. Thermomechanical noise of a free v-shaped cantilever for atomic-force microscopy. , 2001, Ultramicroscopy.
[18] P. Hansma,et al. A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy , 1993 .