Investigation of Dominant Failure Mode(s) for Field-Aged Crystalline Silicon PV Modules Under Desert Climatic Conditions
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[1] Jack Bieker,et al. Data mining solves tough semiconductor manufacturing problems , 2000, KDD '00.
[2] GovindaSamy TamizhMani,et al. Degradation analysis of 1900 PV modules in a hot-dry climate: Results after 12 to 18 years of field exposure , 2013, 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC).
[3] N. R. Sorensen,et al. The effect of metal foil tape degradation on the long-term reliability of PV modules , 2009, 2009 34th IEEE Photovoltaic Specialists Conference (PVSC).
[4] F. J. Pern,et al. Ethylene‐vinyl acetate (EVA) encapsulants for photovoltaic modules: Degradation and discoloration mechanisms and formulation modifications for improved photostability , 1997 .
[5] W. Callaghan,et al. Flat-Plate Solar Array Project: Final report: Volume 1, Executive summary , 1986 .
[6] Dirk C. Jordan,et al. Photovoltaic Degradation Rates—an Analytical Review , 2012 .
[7] Marvin Rausand,et al. System Reliability Theory , 2020, Wiley Series in Probability and Statistics.
[8] Sarah Kurtz,et al. Multi‐pronged analysis of degradation rates of photovoltaic modules and arrays deployed in Florida , 2012 .
[9] T. J. McMahon,et al. History of accelerated and qualification testing of terrestrial photovoltaic modules: A literature review , 2009 .
[10] D. L. King,et al. Diagnostic analysis of silicon photovoltaic modules after 20-year field exposure , 2000, Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036).
[11] T. Arends,et al. Failure analysis of design qualification testing: 2007 VS. 2005 , 2008, 2008 33rd IEEE Photovoltaic Specialists Conference.
[12] Davide Polverini,et al. Polycrystalline silicon PV modules performance and degradation over 20 years , 2012 .
[13] Margaret H. Dunham,et al. Data Mining: Introductory and Advanced Topics , 2002 .
[14] B. Raghuraman,et al. An Overview of SMUD's Outdoor Photovoltaic Test Program at Arizona State University , 2006, 2006 IEEE 4th World Conference on Photovoltaic Energy Conference.
[15] Elmer Collins,et al. Reliability and availability analysis of a fielded photovoltaic system , 2009, 2009 34th IEEE Photovoltaic Specialists Conference (PVSC).
[16] John H. Wohlgemuth,et al. Reliability testing beyond Qualification as a key component in photovoltaic's progress toward grid parity , 2011, 2011 International Reliability Physics Symposium.
[17] D. Berman,et al. EVA laminate browning after 5 years in a grid-connected, mirror-assisted, photovoltaic system in the Negev desert: effect on module efficiency , 1995 .
[18] Marcantonio Catelani,et al. FMECA technique on photovoltaic module , 2011, 2011 IEEE International Instrumentation and Measurement Technology Conference.
[19] Aron Dobos,et al. An Improved Coefficient Calculator for the California Energy Commission 6 Parameter Photovoltaic Module Model , 2012 .
[20] D. C. Carmichael,et al. Methodology for designing accelerated aging tests for predicting life of photovoltaic arrays. Final report , 1977 .
[21] C. R. Osterwald. Terrestrial Photovoltaic Module Accelerated Test-To-Failure Protocol , 2008 .
[22] E. E. van Dyk,et al. Analysis of the effect of parasitic resistances on the performance of photovoltaic modules , 2004 .
[23] Corinne E. Packard,et al. Development of a Visual Inspection Data Collection Tool for Evaluation of Fielded PV Module Condition , 2012 .
[24] R. G. Ross. FSA Engineering and Reliability Development Methods: Can They be Applied Today? , 2012 .
[25] E. E. van Dyk,et al. Assessing the reliability and degradation of photovoltaic module performance parameters , 2004, IEEE Transactions on Reliability.
[26] D. L. King,et al. Photovoltaic module performance and durability following long‐term field exposure , 2000 .
[27] John Bowles,et al. An assessment of RPN prioritization in a failure modes effects and criticality analysis , 2003, Annual Reliability and Maintainability Symposium, 2003..
[28] Michael A. Quintana,et al. Module 30 year life: What does it mean and is it predictable-achievable? , 2000 .
[29] D. C. Carmichael,et al. Measurement Techniques and Instruments Suitable for Life-prediction Testing of Photovoltaic Arrays , 1978 .
[30] Guangbin Yang. Life cycle reliability engineering , 2007 .
[31] R.A. Garcia,et al. Determining Components of Series Resistance from Measurements on a Finished Cell , 2006, 2006 IEEE 4th World Conference on Photovoltaic Energy Conference.
[32] D. Edwards. Data Mining: Concepts, Models, Methods, and Algorithms , 2003 .
[33] M. A. Quintana,et al. Reliability RD DOE Program Review (Presentation) , 2008 .
[34] A. W. Czanderna,et al. Characterization of ethylene vinyl acetate (EVA) encapsulant: Effects of thermal processing and weathering degradation on its discoloration , 1992 .
[35] Myer Ezrin,et al. Investigation of the degradation and stabilization of EVA-based encapsulant in field-aged solar energy modules , 1997 .
[36] Qasem A. Al-Radaideh,et al. Using Data Mining Techniques to Build a Classification Model for Predicting Employees Performance , 2012 .
[37] Susan Agro,et al. Case histories of EVA encapsulant discoloration in fielded modules , 2008 .
[38] Ronald G. Ross. Crystalline-silicon reliability lessons for thin-film modules , 1985 .
[39] A. W. Czanderna,et al. EVA degradation mechanisms simulating those in PV modules , 2008 .
[40] R. Suganya,et al. Data Mining Concepts and Techniques , 2010 .
[41] Michael Koehl,et al. Non-destructive degradation analysis of encapsulants in PV modules by Raman Spectroscopy , 2011 .
[42] M. Ezrin,et al. Investigation into the causes of browning in EVA encapsulated flat plate PV modules , 1994, Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC).
[43] Yingtang Tang,et al. An Evaluation of 27+ Years Old Photovoltaic Modules Operated in a Hot-Desert Climatic Condition , 2006, 2006 IEEE 4th World Conference on Photovoltaic Energy Conference.
[44] Dirk C. Jordan,et al. Measuring degradation rates of PV systems without irradiance data , 2014 .
[45] John H. Wohlgemuth,et al. Using accelerated testing to predict module reliability , 2011, 2011 37th IEEE Photovoltaic Specialists Conference.