Verification of scattering parameter measurements in waveguides up to 325 GHz including highly-reflective devices
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Thorsten Schrader | K. Kuhlmann | R. Dickhoff | J. Dittmer | M. Hiebel | K. Kuhlmann | T. Schrader | J. Dittmer | M. Hiebel | R. Dickhoff
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