论文信息 - Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs - 字舞流文

Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs

K. B. Noh | R. Ritzenthaler | T. Schram | N. Horiguchi | A. Thean | A. Spessot | P. Fazan | M. Aoulaiche | G. Groeseneken | H. Arimura | E. Simoen | T. Kauerauf | Y. Son | M. Cho | F. Crupi | F. Crupi | A. Federico | C. Caillat | H.-J. Na