Spectral resolution in pixel detectors with single photon processing

Pixel detectors based on photon counting or single photon processing readout are becoming popular for spectral X-ray imaging. The detector is based on deep submicron electronics with functions to determine the energy of each individual photon in every pixel. The system is virtually noiseless when it comes to the number of the detected photons. However noise and variations in system parameters affect the determination of the photon energy. Several factors affect the energy resolution in the system. In the readout electronics the most important factors are the threshold dispersion, the gain variation and the electronic noise. In the sensor contributions come from charge sharing, variations in the charge collection efficiency, leakage current and the statistical nature of the charge generation, as described by the Fano factor. The MEDIPIX technology offers a powerful tool for investigating these effects since energy spectra can be captured in each pixel. In addition the TIMEPIX chip, when operated in Time over Threshold mode, offers an opportunity to analyze individual photon interactions, thus addressing charge sharing and fluorescence. Effects of charge sharing and the properties of charge summing can be investigated using MEDIPIX3RX. Experiments are performed using both Si and CdTe detectors. In this paper we discuss the various contributions to the spectral noise and how they affect detector response. The statements are supported with experimental data from MEDIPIX-type detectors.

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