Integrated test concepts for in-situ millimeter-wave device characterization
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Dietmar Kissinger | Robert Weigel | Benjamin Laemmle | Ismail Nasr | Johannes Nehring | A. Oborovski | K. Borutta | R. Weigel | D. Kissinger | I. Nasr | J. Nehring | B. Laemmle | Andreas Oborovski | Karl Borutta
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