A multiscale finite element simulation of piezoelectric materials using realistic crystal morphology

This paper presents the full components of macroscopic homogenized material properties and the microscopic localized response obtained through a multiscale finite element simulation using realistic crystal morphology. Crystal morphology analysis was performed to reveal microstructure and texture of a polycrystalline piezoelectric material. The insulative specimen of piezoelectric material was coated with a conductive layer of amorphous osmium to remove an electric charge, and crystal orientations were measured by means of electron backscatter diffraction. Then the obtained crystal orientations were applied to a multiscale finite element simulation based on homogenization theory.