Role of hole trapping by deep acceptors in electron-beam-induced current measurements in β-Ga2O3 vertical rectifiers
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N. B. Smirnov | S. J. Pearton | I. Shchemerov | E. Yakimov | P. S. Vergeles | F. Ren | E. E. Yakimov | A. Polyakov | A. Chernykh | Minghan Xian | S. Pearton | E. Yakimov