论文信息 - Three‐dimensional analysis of high voltage electron microscope tilt images: Methods and problems

Three‐dimensional analysis of high voltage electron microscope tilt images: Methods and problems

On a developpe un programme de quantification pour obtenir des images tridimensionnelles a partir d'images doubles stereoscopiques pour un analyseur d'images Luzex 5000

K. Hama | Kiyoshi Hama | Tatsuo Arii | T. Arii

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