Mixed-signal circuits and boards for high safety applications

A design methodology for analogue on-line test is presented by means of a real circuit implementation. The test strategy is based on monitoring via a very small analogue checker the inputs of all operational amplifiers of a fully differential circuit. The self-checking properties of the functional circuit are evaluated for a hard/soft fault model. Since the analogue checker outputs a double-rail error indication, the compatibility with digital checkers is ensured and the design of self-checking mixed-signal circuits becomes very simple. The mixed-signal approach as extended to boards through the IEEE Std. 1149.1 digital test bus and a layout rule to avoid interconnect differential shorts.<<ETX>>

[1]  Bapiraju Vinnakota,et al.  The design of analog self-checking circuits , 1994, Proceedings of 7th International Conference on VLSI Design.

[2]  Vladimir Kolarik,et al.  Towards Self-Checking Mixed-Signal Integrated Circuits , 1993, ESSCIRC '93: Nineteenth European Solid-State Circuits Conference.

[3]  Abhijit Chatterjee Concurrent Error Detection in Linear Analog and Switched-Capacitor State Variable Systems Using Continuous Checksums , 1991 .

[4]  Chin-Long Wey,et al.  TEST GENERATION AND CONCURIPENT ERROR DETECTION IN CURRENT-MODE A/D CONVERTERS , 1992, Proceedings International Test Conference 1992.

[5]  Vladimir Kolarik,et al.  Designing self-exercising analogue checkers , 1994, Proceedings of IEEE VLSI Test Symposium.

[6]  Salvador Mir,et al.  Built-in Self-test And Fault Diagnosis Of Fully Differential Analogue Circuits , 1994, IEEE/ACM International Conference on Computer-Aided Design.

[7]  Michael Nicolaidis Finitely self-checking circuits and their application on current sensors , 1993, Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium.

[8]  Marcelo Lubaszewski,et al.  On the design of self-checking boundary scannable boards , 1992, Proceedings International Test Conference 1992.

[9]  Rodham E. Tulloss,et al.  The Test Access Port and Boundary Scan Architecture , 1990 .

[10]  B. Kaminska,et al.  Testing analog circuits by sensitivity computation , 1992, [1992] Proceedings The European Conference on Design Automation.

[11]  José Luis Huertas,et al.  On-line testing of switched-capacitor filters , 1992, Digest of Papers. 1992 IEEE VLSI Test Symposium.