论文信息 - Latchup Paths in Bipolar Integrated Circuits

Latchup Paths in Bipolar Integrated Circuits

A combination of experimental techniques was used to find latchup paths in bipolar circuits. Voltage contrast scanning electron microscopy was applied as an internal probe to analyze latchup paths. Data obtained on six device types show a variety of path combinations and interactions responsible for latchup.

A. H. Johnston | M. P. Baze | A. Johnston | M. Baze

[1] A. Ochoa,et al. Latch-Up Control in CMOS Integrated Circuits , 1979, IEEE Transactions on Nuclear Science.

[2] P. V. Dressendorfer,et al. SAND80-0843 a SEM Technique for Experimentally Locating Latch-Up Paths in Integrated Circuits , 1980 .

[3] D. K. Nichols,et al. Latchup in CMOS Integrated Circuits , 1985 .

[4] A. H. Johnston,et al. Experimental Methods for Determining Latchup Paths in Integrated Circuits , 1985, IEEE Transactions on Nuclear Science.

[5] Enrico Zanoni,et al. An SEM based system for a complete characterization of latch-up in CMOS integrated circuits , 1986 .

[6] Robert W. Dutton,et al. Modeling Latch-Up in CMOS Integrated Circuits , 1982, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[7] B. L. Gregory,et al. Latch-Up in CMOS Integrated Circuits , 1973 .