论文信息 - A look underneath the SiO2/4H-SiC interface after N2O thermal treatments - 字舞流文

A look underneath the SiO2/4H-SiC interface after N2O thermal treatments

S. Lorenti | F. Giannazzo | F. Roccaforte | P. Fiorenza | L. Swanson | A. Frazzetto | M. Alessandrino