A 1-D RHT Method Based on Symmetry Point Searching Used in Ellipse Detection

A 1-D RHT method based on symmetry point searching for ellipse detection is presented in this paper. In this method, three undetermined parameters of the candidate ellipse would be determined by two axisymmetric points and one central symmetry point. The acquisition of the group of symmetric points mentioned above could complete the ellipse detection by using only one dimension accumulation array in parameter space and the demand of the integrity of the ellipse could be largely reduced because of the high possibility of the existence of the group of symmetric points. In addition, the effect of the distortion on the validation of the candidate ellipses would be effectively overcome by the introduction of the validation method based on the ellipse generation and dilation matching.