Built-in self-testing based on compressed 2-dimensional signature analysis

The design of modern electronic systems demands high system reliability and maintainability. In order to perform fault detection, localization and isolation effectively, it is necessary to design a built-in self-testing (BIST) module specific to the corresponding system. This paper presents a BIST method based. on compressed 2-dimensional signature analysis. The principle of compression and performance of test are discussed in detail. Using the presented method, a high faulty coverage ratio (FCR) can be achieved with a short signature compressed in both time domain and space domain. Theoretical analysis shows that this method is reliable and it can be easily implemented in hardware.

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