A new built-in self-test approach for digital-to-analog and analog-to-digital converters

This paper proposes a test approach and circuitry suitable for built-in self-test (BIST) of digital-to-analog (D/A) and analog-to-digital (A/D) converters. Offset, gain, linearity and differential linearity errors are tested without using test equipment. The proposed BIST structure decreases the test cost and test time. The BIST circuitry has been designed to D/A and A/D converters using CMOS 1.2 μm technology. By only a minor modification the test structure would be able to localize the fail situation. The small value of area overhead (AOH), the simplicity and efficiency of the proposed BIST architecture seem to be promising for manufacturing.