论文信息 - Noise in integrated-circuit transistors

Noise in integrated-circuit transistors

Recent noise measurement from 1 Hz to 5 kHz on integrated-circuit transistors have shown an anomalous burst noise in addition to the usual noise spectrum. The terminal characteristics of the burst noise are presented and a phenomenological noise-circuit model is developed.

Richard C. Jaeger | A. J. Brodersen | E. R. Chenette

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