Analysis of in-Plane Conductivity of La1-xSrxF3-x Superionic Thin Films

Electrical properties of thin films of La1-xSrxF3-x solid solutions with x = 0 ÷ 0.24 were measured in temperature range from RT to 300°C and wide frequency range from 10−1 to 106 Hz by impedance spectroscopy method. The spectrums of impedance were analyzed with equivalent circuits contain RC and Warburg parts. DC-conductivities were calculated from RC-circuit of impedance and activation energies determined from Arrhenius-Frenkel equation \( \sigma_{DC} T = \sigma_{0} e^{{\left( { - \frac{{E_{\sigma T} }}{kT}} \right)}} \). Diffusion coefficients and their temperature dependencies were determined from Warburg part of impedance for different SrF2 content.