A new method of XREC data processing based on recognition and analysis of CCD images and simulation of direction of γ families in XREC by the ECSim2.1 program

The passage of γ families through X-ray emulsion chambers (XRECs) is simulated and XREC-induced variations in different characteristics are analyzed. Experimental measuring procedures are also simulated; a new approach to recognition of overlapping dark spots in the families based on the Relay criterion is applied; the comparative analysis of the data of PAMIR experiment and model calculations with regard to the XREC response and measuring procedures is presented.