RAPID COMMUNICATION: RAS - a new process control tool in liquid crystal device fabrication
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[1] W. Zheng,et al. Reflection Anisotropic Spectroscopy as a Tool in the Fabrication of Liquid Crystal Devices , 2001 .
[2] R. Cole,et al. RAS as an in situ Monitor of Ion Bombardment , 2001 .
[3] Sampath Purushothaman,et al. Atomic-beam alignment of inorganic materials for liquid-crystal displays , 2001, Nature.
[4] J. Haaren. Wiping out dirty displays , 2001, Nature.
[5] O. Hunderi,et al. The effect of sputtering-induced disorder on the surface dielectric tensor of Cu(110) , 1999 .
[6] C. Perry,et al. Adsorbate Azimuthal Orientation from Reflectance Anisotropy Spectroscopy , 1998 .
[7] Stanley,et al. Stochastic model for surface erosion via ion sputtering: Dynamical evolution from ripple morphology to rough morphology. , 1995, Physical review letters.
[8] G. Ertl,et al. Imaging Pattern Formation in Surface Reactions from Ultrahigh Vacuum up to Atmospheric Pressures , 1995, Science.
[9] A. A. Studna,et al. Reflectance‐difference spectroscopy system for real‐time measurements of crystal growth , 1988 .
[10] J. S. Patel,et al. The mechanism of polymer alignment of liquid‐crystal materials , 1987 .