Low-Level Dimensional Metrology Process Planning and Execution

For enterprise quality control, it is more sensible and pragmatic to generate a device-independent measurement plan (from the high-level measurement process planning activity) rather than a device-dependent one. The reason is because the workshops or factories may have different types of measurement devices with different measuring capabilities. The device-independent measurement plan will then give certain freedom to the shopfloor to choose available measurement devices. In industry, the dividing line between high-level and low-level measurement planning activity is vague. Generally speaking, the choice of measurement device for a particular measurement plan represents the starting point of low-level dimensional measurement planning activity. Also, measurement plan execution is tightly linked with the low-level measurement planning. Often when the low-level measurement plan.

[1]  P. Gu,et al.  Generative inspection process and probe path planning for coordinate measuring machines , 1996 .

[2]  M. J. Usher Sensors and transducers , 1985 .

[3]  D. J. Medeiros,et al.  Off-line programming of coordinate measuring machines using a hand-held stylus , 1994 .

[4]  C. Greg Jensen,et al.  Flexible in-process inspection through direct control , 2006 .

[5]  William Barkman In-process quality control for manufacturing , 1989 .

[6]  M. Burdekin,et al.  In-process dimensional measurement and control of workpiece accuracy , 1997 .

[7]  Joe Falco,et al.  Interoperability testing for shop floor measurement , 2007 .

[8]  Aristides A. G. Requicha,et al.  Dimensional inspection planning for coordinate measuring machines , 1999 .

[9]  Hans Kurt Tönshoff,et al.  Sensors in manufacturing , 2002 .

[10]  M. Shiraishi,et al.  Scope of in-process measurement, monitoring and control techniques in machining processes—Part 3: In-process techniques for cutting processes and machine tools , 1989 .

[11]  Samir Mekid,et al.  In-process dimensional inspection sensors , 2005 .

[12]  M. Shiraishi,et al.  Scope of in-process measurement, monitoring and control techniques in machining processes—Part 2: In-process techniques for workpieces , 1988 .

[13]  Raghuram Kamath On-Machine Inspection and Acceptance (OMIA) , 2000 .

[14]  Gil-Sang Yoon,et al.  A computer-aided inspection planning system for on-machine measurement — part I: Global inspection planning — , 2004 .

[15]  Kyung-Don Kim,et al.  Synthesis of the measurement system on the machine tool , 2001 .

[16]  Joseph A. Falco,et al.  User's Manual for Version 1.0 of the NIST DME Interface Test Suite for Facilitating Implementations of Version 1.1 of the I++ DME Interface Specification | NIST , 2003 .

[17]  David J. Whitehouse,et al.  Gloss and Surface Topography , 1994 .