论文信息 - Modeling of SEE soft error propagation based on multi-signal flow graph

Modeling of SEE soft error propagation based on multi-signal flow graph

Aiming at evaluating the SEE performance of complex electronic system, the multi-signal flow graph (MSFG) method is adopted. Based on the theory of the MSFG, the SEE soft error propagation model is proposed, and an analysis methodology is stated. For complex electronic system which consists of VLSIs devices, such as SRAM-based FPGA, the MSFG model has been established and simulated in TEAMS software. The fault diagnosis and the average first failure time are estimated. The report indicates that the percentage fault detection is 100%, and the average first failure time of the system varies from 142.4 hours to 4116.7 days.

He Wei | Wang Yueke | Xing Kefei | Zhang Zelong

[1] Michael J. Wirthlin,et al. High-Reliability FPGA-Based Systems: Space, High-Energy Physics, and Beyond , 2015, Proceedings of the IEEE.

[2] Ming Zhang,et al. A soft error rate analysis (SERA) methodology , 2004, ICCAD 2004.

[3] Wang Jiulong. Satellite On-board Failure Statistics and Analysis , 2010 .

[4] Michael Nicolaidis,et al. Soft Errors in Modern Electronic Systems , 2010 .

[5] Irem Y. Tumer,et al. Modeling and Analysis of Safety in Early Design , 2013, CSER.

[6] Liang Shuang,et al. A new multi-signal flow graph based method and implementation for complex system diagnosis , 2015, 2015 IEEE 10th Conference on Industrial Electronics and Applications (ICIEA).

[7] Gao Jun,et al. Pass-Count-Based Path Query on Big Graph Datasets , 2010 .

[8] Yi Jiang,et al. Design and experiment of electron optical system for 0.22THz folded waveguide traveling wave tube , 2015, 2015 IEEE International Vacuum Electronics Conference (IVEC).

[9] F. Miller,et al. New Combined Approach for the Evaluation of the Soft-Errors of Complex ICs , 2013, IEEE Transactions on Nuclear Science.

[10] Shanshan Liu,et al. An initial implementation of testability analysis based on multi-signal flow graph model , 2013, 2013 IEEE 8th Conference on Industrial Electronics and Applications (ICIEA).