A Study on the Erase and Retention Mechanisms for MONOS, MANOS, and BE-SONOS Non-Volatile Memory Devices
暂无分享,去创建一个
Rich Liu | Kuang-Yeu Hsieh | Chih-Yuan Lu | Chao-Hsin Chien | Yan-Kai Chiou | Sheng-Chih Lai | Jung-Yu Hsieh | Erh-Kun Lai | Tai-Bor Wu | E. Lai | K. Hsieh | Chih-Yuan Lu | G. Luo | J. Hsieh | C. Chien | Ming-Jui Yang | Tai-bor Wu | S. Lai | R. Liu | Ming-Jui Yang | Y. Chiou | Guang-Li Luo | Hang-Ting Luea | Chia-Wei Wu | Chia-Wei Wu | Hang-Ting Luea
[1] Chih-Yuan Lu,et al. A transient analysis method to characterize the trap vertical location in nitride-trapping devices , 2004, IEEE Electron Device Letters.
[2] K. Ehresmann,et al. Reply to Arya et al. , 2005 .