Direct resolution of surface atomic steps by transmission electron microscopy

Abstract Long exposure dark-field micrographs have been imaged in weak but finite reflections from evaporated (III)-Au films normally considered forbidden on structure factor grounds. Contrast features in the forbidden reflection images are attributed to single atomic steps in film thickness, and are used to determine the roughness of the (III)-Au surface in detail. The technique provides a powerful general method for studying thin film surfaces.

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