论文信息 - Characterization of Deep Level Defects in 4h and 6H SIC Via DLTS, SIMS And MEV E-Beam Irradiation - 字舞流文

Characterization of Deep Level Defects in 4h and 6H SIC Via DLTS, SIMS And MEV E-Beam Irradiation

E. Janzén | B. Svensson | M. Linnarsson | N. Nordell | A. Schöner | J. Lindström | M. O. Aboelfotoh | C. Harris | J. Doyle | C. Hemrnmingsson | E. Janzén