论文信息 - Ordering of TtertBuCuPc on Si substrates studied by NEXAFS and VB XPS using synchrotron radiation

Ordering of TtertBuCuPc on Si substrates studied by NEXAFS and VB XPS using synchrotron radiation

Investigations of the orientation of copper (II) 2,9,16,23-tetra-tert-butyl phthalocyanine (CuTtertBuPc) molecules in thin films of 10 monolayers thickness prepared in situ on Si(111) and SiO2/Si(111) substrates as well as in Langmuir-Blodgett (LB) films of CuTtertBuPc prepared ex situ on the SiO2/Si(111) substrate were performed by means of valence-band X-ray photoemission spectroscopy (VB XPS) and near-edge X-ray adsorption fine structure (NEXAFS) spectroscopy. Angular dependent VB XPS and NEXAFS spectra taken from in situ evaporated films and ex situ prepared LB films on an SiO2/Si(111) substrate show that the phthalocyanine molecules form well-ordered layers, in which the molecular plane is perpendicular to the substrate surface (standing orientation). In turn, the CuTtertBuPc thin film prepared on the clean Si(111) substrate shows random ordering with a slight preference for a standing orientation of the molecules.

A. Cafolla | C. Hanson | J. Beggan | S. Krasnikov

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