DYNAMIC BEHAVIOR AND SIMULATION OF NANOPARTICLE SLIDING DURING NANOPROBE-BASED POSITIONING

In this paper, the behavior of nanoparticles, manipulated by an atomic force microscope nanoprobe, is investigated. Manipulation by pushing, pulling or picking nanoparticles can result in rolling, sliding, sticking, or rotation behavior. The dynamic simulation of the nanoparticle manipulation, using atomic force microscope (AFM), is performed. According to the dynamics of the system, the AFM pushing force increases to the critical value required for nanoparticle motion. Nanoparticle positioning is designed based on when the nanoparticle is stopped by the AFM in order to move on the substrate. Simulation results for gold particles on a silicon substrate showed that sliding on the substrate is dominant in nanoscales.© 2004 ASME

[1]  H. Hashimoto,et al.  Controlled pushing of nanoparticles: modeling and experiments , 2000 .

[2]  Ernst Meyer,et al.  Nanoscience: Friction and Rheology on the Nanometer Scale , 1996 .

[3]  B. Bhushan,et al.  Introduction to Tribology , 2002 .

[4]  J. Bohr,et al.  A technique for positioning nanoparticles using an atomic force microscope , 1998 .

[5]  Tomomasa Sato,et al.  Kinematics of mechanical and adhesional micromanipulation under a scanning electron microscope , 2002 .

[6]  Ronald P. Andres,et al.  Fabrication of two‐dimensional arrays of nanometer‐size clusters with the atomic force microscope , 1995 .

[7]  L. Samuelson,et al.  Controlled manipulation of nanoparticles with an atomic force microscope , 1995 .

[8]  Richard Superfine,et al.  Mechanics and Friction at the Nanometer Scale , 2000 .

[9]  J. Israelachvili Intermolecular and surface forces , 1985 .

[10]  Aristides A. G. Requicha,et al.  Direct and controlled manipulation of nanometer-sized particles using the non-contact atomic force microscope , 1998 .

[11]  Ronald S. Fearing,et al.  Alignment of microparts using force-controlled pushing , 1998, Other Conferences.

[12]  Ronald S. Fearing,et al.  Survey of sticking effects for micro parts handling , 1995, Proceedings 1995 IEEE/RSJ International Conference on Intelligent Robots and Systems. Human Robot Interaction and Cooperative Robots.

[13]  Tomomasa Sato,et al.  Micro-object Pick and Place Operation under SEM based on Micro-physics , 2002, J. Robotics Mechatronics.

[14]  H. Hashimoto,et al.  Two-dimensional fine particle positioning under an optical microscope using a piezoresistive cantilever as a manipulator , 2000 .

[15]  Hans-Jürgen Butt,et al.  A Technique for Measuring the Force between a Colloidal Particle in Water and a Bubble , 1994 .

[16]  Hans-Jürgen Butt,et al.  Adhesion and Friction Forces between Spherical Micrometer-Sized Particles , 1999 .

[17]  R. Superfine,et al.  Nanometre-scale rolling and sliding of carbon nanotubes , 1999, Nature.

[18]  K. Johnson,et al.  The contribution of micro/nano-tribology to the interpretation of dry friction , 2000 .

[19]  Metin Sitti,et al.  Teleoperated touch feedback from the surfaces at the nanoscale: modeling and experiments , 2003 .

[20]  D. F. Ogletree,et al.  Variation of the Interfacial Shear Strength and Adhesion of a Nanometer-Sized Contact , 1996 .

[21]  G. V. Dedkov Friction on the nanoscale: new physical mechanisms , 1999 .

[22]  Goodarz Ahmadi,et al.  Particle Removal Mechanisms Under Substrate Acceleration , 1994 .

[23]  T. Pöschel,et al.  Rolling as a “continuing collision” , 1999 .

[24]  M. Sitti Atomic force microscope probe based controlled pushing for nanotribological characterization , 2004, IEEE/ASME Transactions on Mechatronics.

[25]  Dror Sarid,et al.  Numerical simulations of a scanning force microscope with a large-amplitude vibrating cantilever , 1994 .

[26]  M. Dahleh,et al.  A model for friction in atomic force microscopy , 2000, Proceedings of the 2000 American Control Conference. ACC (IEEE Cat. No.00CH36334).