GaN: A Reliable Future in Power Conversion: Dramatic performance improvements at a lower cost
暂无分享,去创建一个
Alex Lidow | Johan Strydom | Robert Strittmatter | Chunhua Zhou | J. Strydom | A. Lidow | Chunhua Zhou | R. Strittmatter
[1] M. D. Rooij,et al. Introducing a Family of eGaN FETs for Multi-Megahertz Hard Switching Applications , 2014 .
[2] T. Kazior,et al. Trapping effects in GaN and SiC microwave FETs , 2002, Proc. IEEE.
[3] J. D. del Alamo,et al. Mechanisms responsible for dynamic ON-resistance in GaN high-voltage HEMTs , 2012, 2012 24th International Symposium on Power Semiconductor Devices and ICs.
[4] W. Weibull. A Statistical Distribution Function of Wide Applicability , 1951 .
[5] J. Glaser,et al. GaN Transistors for Efficient Power Conversion , 2019 .
[6] S. Kotz,et al. Maximum likelihood estimation in the 3-parameter weibull distribution: a look through the generalized extreme-value distribution , 1996, IEEE Transactions on Dielectrics and Electrical Insulation.