Sensitivity and Stability Analysis in DEA: Some Recent Developments
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William W. Cooper | Shanling Li | Lawrence M. Seiford | Kaoru Tone | R. Thrall | Joe Zhu | W. Cooper | L. Seiford | Joe Zhu | K. Tone | R. Thrall | Shanling Li | J. Zhu | L. M. Seiford | William W. Cooper | Joe Zhu
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