Observation of microstructures on the recording films of Ag8In14Sb55Te23 and phthalocyanine by AFM

Thin film of Ag8In14Sb55Te23 was prepared by RF-magnetron sputtering method, and the organic dye (phthalocyanine) thin film was prepared by spin coating. Micro- and submicro-size changes induced by laser irradiation on the film were studied by atomic force microscopy (AFM). The characteristic of recorded spots topography is related by recording condition (laser power, pulse width etc.) and properties of material (phase-change or shape-change). The mechanism of microstructure formation is discussed.