Process yield analysis for multivariate linear profiles

Abstract Process capability analysis plays an important role in statistical quality control. We present the process yield index TSpkA to evaluate the process yield for multivariate linear profiles in manufacturing processes. This index provides an exact measure of the process yield. In addition, an approximate confidence interval for TSpkA is constructed. A simulation study is conducted to assess the performance of the proposed method for multivariate linear profiles data under mutually independent normality and multivariate normality. The simulation results confirm that the estimated TSpkA is close to the target value with smaller standard deviation as the sample size increases.

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