论文信息 - High Performance and High Reliability Dual Metal CMOS Gate Stacks Using Novel High-k Bi-layer Control Technique - 字舞流文

High Performance and High Reliability Dual Metal CMOS Gate Stacks Using Novel High-k Bi-layer Control Technique

T. Ando | Y. Tagawa | M. Saito | N. Nagashima | Y. Tateshita | T. Hirano | S. Yamaguchi | K. Tai | R. Yamamoto | S. Kanda | M. Tsukamoto | H. Wakabayashi | H. Iwamoto | S. Kadomura | M. Nakata | I. Oshiyama | K. Tanaka | H. Kumigashira | M. Oshima | S. Toyoda | K. Watanabe