Neutron-induced soft errors, latchup, and comparison of SER test methods for SRAM technologies

In this work we compare neutron-induced soft error rates (SER) and latchup in SRAMs from a variety of manufacturers. SER is found to vary widely between different vendors and technology generations, and some SRAMs show extreme sensitivity to neutron-induced latchup. Continuous spectrum neutron and monoenergetic proton accelerated soft error rate test methods are compared.