Read-disturb and endurance of SSI-flash E/sup 2/PROM devices at high operating temperatures
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Dirk Wellekens | J. Van Houdt | L. Haspeslagh | L. Deferm | G. Groeseneken | J. De Blauwe | H. E. Maes | J. V. Houdt | G. Groeseneken | H. Maes | L. Haspeslagh | D. Wellekens | J. D. Blauwe | Ludo Deferm
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