Trademark images retrieval based on SIFT feature and profile feature

For the limitations of the description on single feature trademark image, a method of trademark image retrieval which is based on profile and SIFT characteristics is proposed. In this method, first step is to get profile by making trademark image to binary image, then contour decomposes the image using rule algorithm and does the Fourier transform on set of reference points of the decomposition. The Fourier coefficient is the profile feature of reference point. Then it detects extreme points on scale space of the trademark image, and describes the extreme points with feature which is SIFT characteristics description of trademark image. Finally, SIFT features is combined with profile features as a new feature for feature description of trademark image.