A Novel Sequential Testing Algorithm Based on Rough-Compact Sets Theory for Multiple Fault Diagnosis
暂无分享,去创建一个
[1] Krishna R. Pattipati,et al. Rollout strategies for sequential fault diagnosis , 2003, IEEE Trans. Syst. Man Cybern. Part A.
[2] Krishna R. Pattipati,et al. Sequential testing algorithms for multiple fault diagnosis , 2000, IEEE Trans. Syst. Man Cybern. Part A.
[3] Krishna R. Pattipati,et al. Test sequencing problems arising in test planning and design for testability , 1999, IEEE Trans. Syst. Man Cybern. Part A.
[4] K. Pattipati,et al. Application of heuristic search and information theory to sequential fault diagnosis , 1988, Proceedings IEEE International Symposium on Intelligent Control 1988.
[5] Krishna R. Pattipati,et al. TEAMS: Testability Engineering and Maintenance System , 1994, Proceedings of 1994 American Control Conference - ACC '94.
[6] Donghyung Kim,et al. Rough sets attributes reduction based expert system in interlaced video sequences , 2006, IEEE Transactions on Consumer Electronics.
[7] Krishna R. Pattipati,et al. Near-optimal sequential testing algorithms for multiple fault isolation , 1994, Proceedings of IEEE International Conference on Systems, Man and Cybernetics.
[8] Krishna R. Pattipati,et al. Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis , 1994 .
[9] Zhongzhi Shi,et al. A New Pattern Recognition Algorithm Based on Fuzzy Association Degree , 2005, 2005 International Conference on Neural Networks and Brain.