Simulating Interface Growth and Defect Generation in CZT – Simulation State of the Art and Known Gaps
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Fei Gao | Eric J. Bylaska | Charles H. Henager | Nicholas Zabaras | Guang Lin | Shenyang Y. Hu | N. Zabaras | E. Bylaska | C. Henager | Shenyang Hu | G. Lin | F. Gao
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