论文信息 - Electron Trapping in Extended Defects in Microwave AlGaN/GaN HEMTs With Carbon-Doped Buffers - 字舞流文

Electron Trapping in Extended Defects in Microwave AlGaN/GaN HEMTs With Carbon-Doped Buffers

N. Rorsman | O. Kordina | E. Sveinbjörnsson | M. Thorsell | J. Bergsten | David Adolph | Jr-Tai Chen