Energy placement of the D− dangling-bond transition in a-Si:H from photocapacitance and photocurrent spectroscopies

[1]  H. Okushi Gap states in phosphorus-doped amorphous silicon studied by isothermal capacitance transient spectroscopy , 1985 .

[2]  Tsai,et al.  Energy dependence of the optical matrix element in hydrogenated amorphous and crystalline silicon. , 1985, Physical review. B, Condensed matter.

[3]  Johnson,et al.  Identification of deep-gap states in a-Si:H by photo- depopulation-induced electron-spin resonance. , 1985, Physical review. B, Condensed matter.

[4]  W. Jackson,et al.  Charge transient and optical absorption measurements of characteristic gap states in phosphorus doped a-Si:H , 1984 .

[5]  W. Spear,et al.  The investigation of excess carrier lifetimes in amorphous silicon by transient methods , 1984 .

[6]  N. Johnson Measurement of deep levels in hydrogenated amorphous silicon by transient voltage spectroscopy , 1983 .

[7]  N. Amer,et al.  Energy dependence of the carrier mobility-lifetime product in hydrogenated amorphous silicon , 1983 .

[8]  W. Jackson The correlation energy of the dangling silicon bond in a Si:H , 1982 .

[9]  D. Lang,et al.  Measurement of the density of gap states in hydrogenated amorphous silicon by space charge spectroscopy , 1982 .

[10]  Warren Jackson,et al.  DIRECT MEASUREMENT OF GAP STATE ABSORPTION IN HYDROGENATED AMORPHOUS SILICON BY PHOTOTHERMAL DEFLECTION SPECTROSCOPY , 1982 .

[11]  K. Wecht,et al.  Identification of the Dangling-Bond State within the Mobility Gap of a-Si: H by Depletion-Width-Modulated ESR Spectroscopy , 1982 .

[12]  B. G. Brooks,et al.  Disorder and the Optical-Absorption Edge of Hydrogenated Amorphous Silicon , 1981 .

[13]  R. Street,et al.  Defect states in doped and compensated a-Si: H , 1981 .