论文信息 - Ablated Transformation and Dielectric of SiO2/SiO2 Nanocomposites Dipped with Silicon Resin

Ablated Transformation and Dielectric of SiO2/SiO2 Nanocomposites Dipped with Silicon Resin

SiO2/ SiO2 nanocomposites dipped with silicon resin was ablated and the physical state and phase transformation were characterized. Trace impurity in raw material and compound obtained by chemical reaction were analyzed. Moreover, the high-temperature dielectric properties were investigated. On the basis of above, it is found that the impurity carbon and silicon carbide are the key factors influencing dielectric properties.

[1] P. Ehrburger,et al. Synthesis of tubular silicon carbide (SiC) from a carbon–silica material by using a reactive replica technique: mechanism of formation of SiC , 2004 .

[2] Jinwang Li,et al. Synthesis of SiC precursors by a two-step sol-gel process and their conversion to SiC powders , 2000 .

[3] A. Kassiba,et al. Conduction and dielectric behaviour of SiC nano-sized materials , 2000 .

[4] M. González,et al. The role of C-impurities in alumina dielectrics , 2004 .